The article at onjava seems to imply that basis path coverage is a sufficient substitute for full path coverage, due to some linear-independence/cyclomatic-complexity magic.
Using an example similar to the article:
public int returnInput(int x, boolean one, boolean two)
{
int y = x;
if(one)
{
y = x-1;
}
if(two)
{
x = y;
}
return x;
}
with the basis set {FF,TF,FT}, the bug is not exposed. Only the untested TT path would expose it.
So, how is basis path coverage useful? It doesn't seem much better than branch coverage.
[Disclaimer: I've never heard of this technique before, it just looks interesting so I've done a few searches and here's what I think I've found out. Hopefully someone who knows what they're talking about will contribute too...]
I think it's supposed to be a better way of generating branch coverage tests, not a complete substitute for path coverage. There's a far longer document here which restates the goals a bit: http://www.westfallteam.com/sites/default/files/papers/Basis_Path_Testing_Paper.pdf
The onjava article says "the goal of basis path testing is to test all decision outcomes independently of one another. Testing the four basis paths achieves this goal, making the other paths extraneous"
I think "extraneous" here means, "unnecessary to the goal of basis path testing", not as one might assume, "a complete waste of everyone's time".
I think the point of testing branches independently, is to break those accidental correlations between the paths which work, and the paths you test, that occur with terrifying frequency when I write both the code and an arbitrary set of branch coverage tests myself. There's no magic in the linear independence, it's just a systematic way of generating branch coverage, which discourages the tester from making the same assumptions as the programmer about correlation between branch choices.
So you're right, basis path testing misses your bug, and in general misses 2^(N-1)-N bugs, where N is the cyclomatic complexity. It just aims not to miss the 2^(N-1)-N paths most likely to be buggy, as letting the coder choose N paths to test typically does ;-)
path coverage is no better than any other coverage metrics - it is just that metrics that shows how much of 'code' has been tested. The fact that you can achieve 100% branch coverage with (TF,FT) set of TCs as well as (TT,FF) means it is all up to your luck if your exit criteria tell you exit after 100% coverage is done.
The coverage should not be a focus for the tester - finding bugs should be and TC is just a way to show the bug just as well as coverage a proxy showing how much of this showing the bug activity has been done. As with all other white box methods - striving for max coverage with minimum costs require actually understanding the code so that you could actually write a defect w/o a TC. TC is just good for regression and as a documentation of the defect.
As a tester coverage is just a hint on how much has been done - only experience can be really helpful as to say how much is enough. As this is difficult to present in numerical values we use other methods i.e. coverage statistics.
Not sure if this makes sense to you I guess judging on the date you are far gone since the date you publish your question...
My recollection from McCabe's work on this exact subject is: you generate the basis paths systematically, changing one condition at a time, and only changing the last condition, until you can't change any new conditions.
Suppose we start with FF, which is the shortest path. Following the algorithm, we change the last if in the chain, yielding FT. We've covered the second if now, meaning: if there was a bug in the second if, surely our two tests were paying attention to what happened when the second if statement suddenly started executing, otherwise our tests aren't working or our code isn't verifiable. Both possibilities suggest our code needs reworking.
Having covered FT, we go back up one node in the path and change the first T to F. When building basis paths, we only change one condition at a time. So we are forced to leave the second if the same, yielding... TT!
We are left with these basis paths: {FF, FT, TT}. Which address the issue you raised.
But wait, you say, what if the bug occurs in the TF case?? The answer is: we should have already noticed it between two of the other three tests. Think about it:
The second if already had its chance to demonstrate its effect on the code independently any other changes to the execution of the program through the FF and FT tests.
The first if had its chance to demonstrate its independent effect going from FT to TT.
We could have started with the TT case (the longest path). We would have arrived at slightly different basis paths, but they would still exercise each if statement independently.
Notice in your simple example, there is no co-linearity in the conditions of the if statements. Co-linearity cripples basis path generation.
In short: basis path testing, done systematically, avoids the problems you think it has. Basis path testing doesn't tell you how to write verifiable code. (TDD does that.) More to the point, path testing doesn't tell you which assertions you need to make. That's your job as the human.
Source: this is my research area, but I read McCabe's paper on this exact subject a few years back: http://mccabe.com/pdf/mccabe-nist235r.pdf
Related
I have following question. I set up an camel -project to parse certain xml files. I have to selecting take out certain nodes from a file.
I have two files 246kb and 347kb in size. I am extracting a parent-child pair of 250 nodes in the above given example.
With the default factory here are the times. For the 246kb file respt 77secs and 106 secs. I wanted to improve the performance so switched to saxon and the times are as follows 47secs and 54secs. I was able to cut the time down by at least half.
Is it possible to cut the time further, any other factory or optimizations I can use will be appreciated.
I am using XpathBuilder to cut the xpaths out. here is an example. Is it possible to not to have to create XpathBuilder repeatedly, it seems like it has to be constructed for every xpath, I would have one instance and keep pumping the xpaths into it, maybe it will improve performance further.
return XPathBuilder.xpath(nodeXpath)
.saxon()
.namespace(Consts.XPATH_PREFIX, nameSpace)
.evaluate(exchange.getContext(), exchange.getIn().getBody(String.class), String.class);
Adding more details based on Michael's comments. So I am kind of joining them, will become clear with my example below. I am combining them into a json.
So here we go, Lets say we have following mappings for first and second path.
pData.tinf.rexd: bm:Document/bm:xxxxx/bm:PmtInf[{0}]/bm:ReqdExctnDt/text()
pData.tinf.pIdentifi.instId://bm:Document/bm:xxxxx/bm:PmtInf[{0}]/bm:CdtTrfTxInf[{1}]/bm:PmtId/bm:InstrId/text()
This would result in a json as below
pData:{
tinf: {
rexd: <value_from_xml>
}
pIdentifi:{
instId: <value_from_xml>
}
}
Hard to say without seeing your actual XPath expression, but given the file sizes and execution time my guess would be that you're doing a join which is being executed naively as a cartesian product, i.e. with O(n*m) performance. There is probably some way of reorganizing it to have logarithmic performance, but the devil is in the detail. Saxon-EE is quite good at optimizing join queries automatically; if not, there are often ways of doing it manually -- though XSLT gives you more options (e.g. using xsl:key or xsl:merge) than XPath does.
Actually I was able to bring the time down to 10 secs. I am using apache-camel. So I added threads there so that multiple files can be read in separate threads. Once the file was being read, it had serial operation to based on the length of the nodes that had to be traversed. I realized that it was not necessary to be serial here so introduced parrallelStream and that now gave it enough power. One thing to guard agains is not to have a proliferation of threads since that can degrade the performance. So I try to restrict the number of threads to twice or thrice the number of cores on the operating machine.
I have process parameter data from semiconductor manufacturing.and requirement is to suggest what could be the best parameter adjustment to be made to process parameter to get better yield ie best path for high yield. what machine learning /Statistical models best suits this requirement
Note:I have thought of using decision tree which can give us best path for high yield.
Would like to know it any other methods that can be more efficient
data is like
lotno x1 x2 x3 x4 x5 yield(%)
<95% yield is considered as 0 and >95% as 1
I'm not really sure of the question here, but as a former semiconductor process engineer, here is how I look at the yield improvement approach - perspective.
Process Development.
DOE: Typically, I would run structured DOEs to understand my process (#4). I would first identify "potential" 'factors', and run various "screening" experiments to identify statistical significance. With the goal basically here to identify the most statistically significant (and for that matter, least significant) factors. So these are inherently simple experiments, low # of "levels" which don't target understanding of the curvature of the response surface, they just look for magnitude change of response vs factor. Generally, I am most concerned with 'Process' factors, but it is important to recognize that the influence of variable inputs can come from more than just "machine knobs' as example. Variable can arise from 1) People, 2) Environment (moisture, temp, etc), 3) consumables (used in the process), 4) Equipment (is 40 psi on this tool really 40 psi and the same as 40 psi on a different tool) 4) Process variable settings.
With the most statistically significant factors, I would run more elaborate DOE using the major factors and analyze this data to develop a model. There are generally more 'levels' used here to allow for curvature insight of the response surface via the analysis. There are many types of well known standard experimental design structures here. And there is software such as JMP that is specifically set up to do this analysis.
From here, the idea would be to generate a model in the form of Response = F (Factors). That allows you to essentially optimize the response based upon these factors where the response is a reflection of your yield criteria.
From here, the engineer would typically execute confirmation runs with optimized factors to confirm optimized response.
Note that the software analysis typically allows for the engineer to illuminate any run order dependence. The execution of the DOE is typically performed in a randomized cell fashion. (Each 'cell' is a set of conditions for the experiment). Similarly the experiments include some level of repetition to gauge 'repeatability' of the 'system'. This inclusion can be explicit (run the same cell twice), but there is also some level of repeatability inherent in the design as well since you are running multiple cells, albeit at difference settings. But generally, the experiment includes explicitly repeated cells.
And finally there is the concept of manufacturability, which includes constraints of time, cost, physical limits, equipment capability, etc. (The ideal process works great, but it takes 10 years, costs 1 million dollars and requires projected settings outsides the capability of the tool.)
Since you have manufacturing data, hopefully, you have the data that captures the other types of factors as well (1,2,3), so you should specifically analyze the data to try to identify such effects. This is typically done as A vs B comparisons. Person A vs B, Tool A vs B, Consumable A vs B, Consumable lot A vs B, Summer vs Winter, etc.
Basically, there are all sorts of comparisons you could envision here and check for statistically differences across two sets of populations.
A comment on response: What is the yield criteria? You should know this in order to formulate the model. For semiconductors, we have both line yield (process yield) but there is also device yield. I assume for your work, you are primarily concerned with line yield. So minimizing variability in the factors (from 1,2,3,4) to achieve the desired response (target response(s) with minimal variability) is the primary goal.
APC (Advanced Process Control).
In many cases, there is significant trending that results from whatever reason; crappy tool control (the tool heats up), crappy consumable (the target material wears, the polishing pad wears, the chemical bath gets loaded, whatever), and so the idea here is how to adjust the next batch/lot/wafer based upon the history of what came prior. Either improve the manufacturing to avoid/minimize this trending (run order dependence) or adjust process to accommodate it to achieve the desired response.
Time for lunch, hope this helps...if you post on the specific process module type, and even equipment and consumables, I might be able to provide more insight.
Was wondering if anyone out there can help.......
My company works in the travel industry and one of the product we provide is the function of buying a flight and hotel together.
One of the advantages of this is that sometimes a visitor can save on a hotel if they buy the package together.
What I want to be able to track is the following:
The hotel which has the saving on it (accomodation code); the saving that they will make; the price of the package that they will pay.
I am new to implementing but have been told by a colleague that I can use a context variable.
Would anyone be able to tell me how I should write this please?
Kind Regards
Yaser
Here is the document entry for Context Data Variables
For example, in the custom code section of the on-page code, within s_doPlugins or via some wrapper function that ultimately makes a s.t() or s.tl() call, you would have:
s.contextData['package.code'] = "accommodation code";
s.contextData['package.savings'] = "savings";
s.contextData['package.price'] = "price";
Then in the interface you can go to processing rules and map them to whatever props or eVars you want.
Having said that...processing rules are pretty basic at the moment, and to be honest, it's not really worth it IMO. Firstly, you have to get certified (take an exam and pass) to even access processing rules. It's not that big a deal, but it's IMO a pointless hoop to jump through (tip: if you are going to go ahead and take this step, be sure to study up on more than just processing rules. Despite the fact that the exam/certification is supposed to be about processing rules, there are several questions that have little to nothing to do with them)
2nd, context data doesn't show up in reports by themselves. You must assign the values to actual props/eVars/events through processing rules (or get ClientCare to use them in a vista rule, which is significantly more powerful than a processing rule, but costs lots of money)
3rd, the processing rules are pretty basic. Seriously, you're limited to just simple stuff like straight duping, concatenating values, etc.
4th, processing rules are limited in setting events, and won't let you set the products string. IOW, You can set a basic (counter) event, but not a numeric or currency event (an event with a custom value associated with it). Reason I mention this is because those price and savings values might be good as a numeric or currency event for calculated metrics. Well since you can't set an event as such via processing rules, you'd have to set the events in your page code anyways.
The only real benefit here is if you're simply looking to dupe them into a prop/eVar and that prop/eVar varies from report suite to report suite (which FYI, most people try to keep them consistent across report suites anyways, and people rarely repurpose them).
So if you are already being consistent across multiple report suites (or only have like 1 report suite in the first place), since you're already having to put some code on the site, there's no real incentive to just pop the values in the first place.
I guess the overall point here is that since the overall goal is to get the values into actual props, eVars and possibly events, and processing rules fail on a lot of levels, there's no compelling reason not to just pop them in the first place.
I am searching for ideas/examples on how to store path patterns from users - with the goal of analysing their behaviours and optimizing on "most used path" when we can detect them somehow.
Eg. which action do they do after what, so that we later on can check to see if certain actions are done over and over again - therefore developing a shortcut or assembling some of the actions into a combined multiaction.
My first guess would be some sort of "simple log", perhaps stored in some SQL-manner, where we can keep each action as an index and then just record everything.
Problem is that the path/action might be dynamically changed - even while logging - so we need to be able to take care of this fact too, when looking for patterns later.
Would you log everthing "bigtime" first and then POST-process every bit of details after some time or do you have great experience with other tactics?
My worry is that this is going to take up space, BIG TIME while logging 1000 users each day for a month or more.
Hope this makes sense and I am curious to see if anyone can provide sample code, pseudocode or perhaps links to something usefull.
Our tools will be C#, SQL-database, XML and .NET 3.5 - clients could also get .NET 4.0 if needed.
Patterns examples as we expect them
...
User #1001: A-B-A-A-A-B-C-E-F-G-H-A-A-A-C-B-A
User #1002: B-A-A-B-C-E-F
User #1003: F-B-B-A-E-C-A-A-A
User #1002: C-E-F
...
etc. no real way to know what they do next nor how many they will use, how often they will do it.
A secondary goal, if possible, if we later on add a new "action" called G (just sample to illustrate, there will be hundreds of actions) how could we detect these new behaviours influence on the previous patterns.
To explain it better, my thought here would be some way to detect "patterns within patterns", sort of like how compressions work, so that "repeative patterns" are spottet. We dont know how long these patterns might be, nor how often they might come. How do we break this down into "small bits and pieces" - whats the best approach you think?
I am not sure what you mean by path, but, if you gave every action in a path a unique symbol, you could reduce the problem to longest common substring or subsequence.
Or have a map of paths to the number of times that action occurred. Every time a certain path happens, increment the count for that path. Then sort to find the most common.
Pseudo idea/implementation so far
Log ever users action into a list/series of actions, bulk kinda style (textfiles/SQL - what ever, just store the whole thing for post-processing)
start counting every "1 action", "2 actions", "3 actions" up til a certain amount (lets say 30 levels)
sort them all, by giving values of importants to some of the actions (might be those producing end results)
A usefull result perhaps?
If we count all [A], [A-A], [A-B], [A-C], [A-A-A], [A-A-B] etc. its going to make a LONG and fine list of which actions are used in row frequently, and thats in the right direction, because if some of these results gets too high, we might need a shorter path. Problem is then, whats too few actions to be optimized and whats the longest needed actionlist to search for? My guess is that we need to do this counting first, then examine the numbers.
Problem is that this would be part of an analyzing tool we are developing and we dont have data until implementation, so we dont know what to look for before its actually done. hmm... wondering if there really IS an answer to this one.
After months of frustration and of time spent in inserting needles in voodoo dolls of previous developers I decided that it is better try to refactor the legacy code.
I already ordered Micheal Feather's book, I am into Fowler's refactoring and I made some sample projects with DUnit.
So even if I don't master the subject I feel it is time to act and put some ideas into practice.
Almost 100% of the code I work on has the business logic trapped in the UI, moreover all is procedural programming (with some few exceptions). The application started as quick & dirty and continued as such.
Now writing tests for all the application is a meaningless task in my case, but I would like to try to unittest something that I need to refactor.
One of the complex tasks one big "TForm business logic class" does is to read DB data, make some computations and populate a scheduler component. I would like to remove the reading DB data and computation part and assign to a new class this task. Of course this is a way to improve the current design, it is not the best way for starting from scratch, but I'd like to do this because the data returned by this new class is useful also in other ways, for example now I've been ask to send e-mail notifications of scheduler data.
So to avoid a massive copy and paste operation I need the new class.
Now the scheduler is populated from a huge dataset (huge in size and in number of fields), probably a first refactoring step could be obtaining the dataset from the new class. But then in the future I'd better use a new class (like TSchedulerData or some other name less bound to scheduler) to manage the data, and instead of having a dataset as result i can have a TSchedulerData object.
Since refactor occurs at at small steps and tests are needed to refactor better I am a little confused on how to proceed.
The following points are not clear to me:
1) how to test a complex dataset? Should I run the working application, save one result set to xml, and write a test where I use a TClientDataSet containing that xml data?
2) How much do I have to care about TSchedulerData? I mean I am not 100% sure I will use TSchedulerData, may be I will stick with the Dataset, anyway thinking of creating complex tests that will be discarded in 2 weeks is not appealing for a DUnitNewbee. Anyway probably this is how it works. I can't imagine the number of bugs that I would face without a test.
Final note: I know someone thinks rewriting from scratch is a better option, but this is not an option. "The application is huge and it is sold today and new features are required today not to get out of business". This is what I have been told, anyway refactoring can save my life and extend the application life.
Your eventual goal is to separate the UI, data storage and business logic into distinct layers.
Its very difficult to test a UI with automatic testing frameworks. You'll want to eventually separate as much of the business logic from the UI as possible. This can be accomplished using one of the various Model/View/* patterns. I prefer MVP passive view, which attempts to make the UI nothing more than an interface. If you're using a Dataset MVP Supervising Controller may be a better fit.
Data storage needs to have its own suite of tests but these are different from unit tests (though you can use the same unit testing framework) and there are usually fewer of them. You can get away with this because most of the heavy lifting is being done by third party data components and a dbms (in your case T*Dataset). These are integration tests. Basically making sure your code plays nice with the vendor's code. Also needed if you have any stored procedures defined in the DB. They are much slower that unit tests and don't need to be run as often.
The business logic is what you want to test the most. Every calculation, loop or branch should have at least one test(more is preferable). In legacy code this logic often touches the UI and db directly and does multiple things in a single function. Here Extract Method is your friend. Good places to extract methods are:
for I:=0 to List.Count - 1 do
begin
//HERE
end;
if /*HERE if its a complex condition*/ then
begin
//HERE
end
else
begin
//HERE
end
Answer := Var1 / Var2 + Var1 * Var3; //HERE
When you come across one of these extraction points
Decide what you want the method signature to look like for your new method: Method name, parameters, return value.
Write a test that calls it and checks the expected outcome.
Extract the method.
If all goes well you will have a newly extracted method with at least one passing unit test.
Delphi's built in Extract Method doesn't give you any way to adjust the signature so if that's your own option you'll have to make do and fix it after extraction. You'll also want to make the new method public so your test can access it. Some people balk at making a private utility method public but at this early stage you have little choice. Once you've made sufficient progress you'll start to see that some utility methods you've extracted belong in their own class (in which case they'd have to be public anyway) while others can be made private/protected and tested indirectly by testing methods that depend on them.
As your test suite grows you'll want to run them after each change to ensure your latest change hasn't broken something elsewhere.
This topic is much too large to cover completely in an answer. You'll find the vast majority of your questions are covered when that book arrives.
I'd say approach it in focussed baby steps.
Step#1: Should always be to get some tests around your area of invasion TForm - regression tests aka safety net. In your case, sense what the app is doing. From what I read, it seems to be a data transformer. So spend time to understand all (or most important if all is not feasible) combinations of input data and the corresponding output schedules. Write them up as tests. Ensure that all tests pass.
Step#2: Now attempt your refactorings. Move blocks of code into cohesive classes etc all under the safety of the regression net.
Testing complex datasets - testing file dumps should be the last resort. But in this case, it seems like a simple option to get started. Maybe you could later make it a first class domain object TSchedule with its own Equals() implementation. Defer design decisions/changes until you have a solid regression test suite around your area of modification.